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The Microscopy Series: Scanning Electron Microscope

The #ScanningElectronMicroscope (SEM) uses a focused beam of high energy #electrons to generate signals from the surface of specially prepared specimens. It has various components including #ElectronGun, #ElectronLens to #EDSDetectors and data output devices. #SEM has revolutionized #microscopy and #CellBiology in the last couple of years.

Principle

  1. Accelerated electrons in a #SEM carry significant amounts of #KineticEnergy, and this energy is dissipated as a variety of signals produced by electron-sample interactions when the incident electrons are decelerated in the solid sample.

  2. The signals include secondary electrons, back-scattered electrons (#BSE), diffracted back-scattered electrons (#DBSE, that are used to determine crystal structures and orientations of minerals), #photons (characteristic X rays that are used for elemental analysis and continuum X rays), visible light (#Cathodoluminescence) and heat.

  3. Photons are produced by inelastic collisions of the incident electrons with electrons in discrete orbitals of atoms in the sample.

  4. Secondary electrons are mainly used for showing #morphology and #topography of samples and #BSE are valuable for illustrating contrast in composition of #multiphase samples (for rapid phase discrimination).

  5. #SEM analysis is "non-destructive" as photons generated by electron interactions do not lead to volume loss of the sample, so it is possible to analyze the same sample repeatedly with #reproducibility.

Merits

  1. It is easier to operate than #TEM and has user-friendly "intuitive" interfaces.

  2. Areas ranging from 1cm to 5microns width can be imaged with #SEM. Magnification range 20X to ~30,000X. Spatial resolution 50 to 100nm.

  3. #Minimal sample preparation required.

  4. #rapid data acquisition: <5 minutes per image for #SEI, #BSE, spot #EDS analysis.

  5. Data generated in digital formats which are #portable.

Demerits

  1. Samples must be #solid and fit into the microscope #chamber.

  2. For most machines, samples must be #stable in a #vacuum on the order of 10^-5 to 10^-6 torr.

  3. Samples likely to outgas at low pressures and to decrepitate at low pressure are #unsuitable.

  4. Samples need to be electrically insulated with an electrically conductive coating.

Applications

  1. It is routinely used for generation of high resolution images of shapes of objects and showing #spatial variations in #chemical compositions.

  2. It is also used to identify phases based on qualitative chemical analysis and/or #crystalline structure using back-scattered electrons (#BSE).

  3. #CompositionalMaps can be prepared based on differences in trace element "activators" using #Cathodoluminescence.


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